SME-friendly
The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
- Buyer
- Danmarks Tekniske Universitet - DTU, Kgs. Lyngby
- Country
- Denmark
- Estimated value
- —
- Deadline
- 16 Nov 2026, 08:00 CET
- Published
- 15 Oct 2026
- Procedure
- Open procedure
- Contract type
- Supplies
Categories
From the original notice
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.
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54 awards in 12 months · 49 different winners
Based on contract award notices on TED. Award data can be incomplete.
Only the original notice and the buyer's documents are legally binding.