Semi-Automatic Wafer Prober System for Characterization of 200-mm Wafers
- Buyer
- IHP GmbH - Lebniz-Institut für innovative Mikroelektronik, Frankfurt (Oder)
- Country
- Germany
- Estimated value
- —
- Deadline
- 29 Oct 2026, 12:00 CET
- Published
- 29 Sept 2026
- Procedure
- Open procedure
- Contract type
- Supplies
Categories
- 38540000 Machines and apparatus for testing and measuring
From the original notice
The subject of the procurement is the supply, installation and commissioning of a semi-automatic wafer prober system for the electrical and high-frequency characterization of 200-mm wafers for research and laboratory use at IHP. The system shall include, among other components, a 200-mm wafer prober with vacuum chuck and precision positioning, individual probes, multi-contact probes for RF measurements up to at least 6 GHz, a probe card system, automated microscopy and camera equipment, as well as control and software components. The scope of supply also includes transport, installation,…
Only the original notice and the buyer's documents are legally binding.