Semi-automatic prober for characterization of 200 mm wafers
- Buyer
- IHP GmbH - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder)
- Country
- Germany
- Estimated value
- —
- Deadline
- 13 Oct 2026, 12:00 CEST
- Published
- 14 Sept 2026
- Procedure
- Open procedure
- Contract type
- Supplies
Categories
- 38540000 Machines and apparatus for testing and measuring
From the original notice
Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be integrated with the existing Keithley 4200A-SCS characterization system. The scope includes the prober, temperature-controlled chuck, electrical probes, optical and camera systems, control hardware and software, cabling and interfaces, installation, commissioning, operator training and integration…
Only the original notice and the buyer's documents are legally binding.